The Spectra Ultra S/TEM introduces the next era in EDX detection with the Ultra-X EDX detector. Offering a solid angle (>4.45 Sr) at least double that of any other EDX detector solution, the ...
Low vacuum mode for investigation of non-conducting samples (ESEM) Magnification 30x to 30,000x Accelerating voltage of 5-15 kV Sample size up to 70 mm in diameter and 50 mm thickness Oxford ...
The Energy Dispersive X-Ray (EDX) Silicon Drift Detector (SDD) is fully incorporated into the NANOS. The operator can choose EDX Point Analysis or activate Elemental Mapping using the User Interface.
Energy dispersive X-ray spectroscopy (EDX) is a kind of scanning electron microscopy that involves X-ray micro-analysis. The key features of this technique are: Non-destructive qualitative analysis ...
Energy dispersive X-ray spectroscopy (EDX) is a kind of scanning electron microscopy that involves X-ray micro-analysis. The key features of this technique are: Non-destructive qualitative analysis ...
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Enhancing EBSD Analysis of Nickel-Based AlloysImage Credit: Hitachi High-Tech Europe The EBSD measurements were conducted on the High-Resolution Analytical VP SU7000 FE-SEM, equipped with an Oxford EDX (Ultim100), an EBSD detector (Symmetry ...
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